发明名称 |
WAFER CARRIER WITH VARYING THERMAL RESISTANCE |
摘要 |
PROBLEM TO BE SOLVED: To provide a chemical vapor deposition apparatus that provides better temperature uniformity across the surface of each wafer, and better temperature uniformity across the entire wafer carrier.SOLUTION: A water carrier 32 has a top surface 34 holding wafers, and a bottom surface 36 heated by radiant heat transfer from a heating element 28. The bottom surface 36 of the wafer carrier is non-planar due to features such as depressions 54 so that the wafer carrier has different thickness at different locations. The thicker portions of the wafer carrier have higher thermal resistance. Differences in thermal resistance at different locations counteract undesired non-uniformity in heat transfer to the wafer. The wafer carrier may have pockets with projections for engaging separate locations on the edges of the wafer. |
申请公布号 |
JP2014207465(A) |
申请公布日期 |
2014.10.30 |
申请号 |
JP20140116706 |
申请日期 |
2014.06.05 |
申请人 |
VEECO INSTRUMENTS INC |
发明人 |
BORIS VOLF;BREID SODERMAN;ERIC A ARMOUR |
分类号 |
H01L21/683;C23C16/458;H01L21/205;H01L21/31 |
主分类号 |
H01L21/683 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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