| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray diffraction measurement system allowing short time measurement of the states of a plurality of spots on a measuring object using a diffraction X-ray.SOLUTION: A control of a controller 91 relatively moves, to a steel pipe, a case 10 in which an X-ray emission device 20, a table 32, an imaging plate 33 and a laser detection device 40 are arranged, irradiates the steel pipe with an X-ray from the X-ray emission device 20 while rotating the table 32 and the imaging plate 33, and forms an image formed by diffraction X-ray through a slit continuously along a circumferential direction of the imaging plate 33. A laser beam irradiation position by the laser detection device 40 is swept along a radial direction of the imaging plate 33, and received light intensity data indicating an intensity of light received by the laser detection device 40 is read corresponding to the circumferential position and the radial directional position, with the imaging plate 33 being rotated. |
