发明名称 |
Semiconductor device and method for producing the same |
摘要 |
A semiconductor device satisfies the condition Db ‰¤ (1/3) x Da, in which Da represents a distance between a top surface of a cathode segment (22) and an end of an embedded gate segment (26) facing an anode segment (24), and Db represents a distance between a highest-impurity concentration portion in the embedded gate segment (26) and an end of the cathode segment (22) facing the anode segment (24). |
申请公布号 |
EP2629333(A3) |
申请公布日期 |
2014.10.29 |
申请号 |
EP20130155399 |
申请日期 |
2013.02.15 |
申请人 |
NGK INSULATORS, LTD. |
发明人 |
SHIMIZU, NAOHIRO;YOKOI, SHOJI |
分类号 |
H01L29/739;H01L21/225;H01L21/331 |
主分类号 |
H01L29/739 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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