发明名称 |
Systems and methods to initiate updating of reference voltages |
摘要 |
In a data storage device that includes a non-volatile memory, a method includes determining that a current error correction code page count (CEC) is at least as large as a target error correction code page count (TEC). The CEC is a page count of error correction code (ECC) pages of data read from the memory during a time period from a previous time to a particular time using a set of reference voltages. In response to the CEC being at least as large as the TEC, the method includes updating a subset of the set of reference voltages conditioned upon a difference between a current mean error count (CMEC) and a previous mean error count being at least as large as a target mean delta error. The CMEC is based on a count of read errors associated with the ECC pages read during the time period. |
申请公布号 |
US8874992(B2) |
申请公布日期 |
2014.10.28 |
申请号 |
US201213630686 |
申请日期 |
2012.09.28 |
申请人 |
Sandisk Technologies Inc. |
发明人 |
Desireddi Sateesh;Naradasi Jayaprakash;Venkitachalam Anand;D'Abreu Manuel Antonio;Skala Stephen |
分类号 |
G11C29/00;G11C11/56;G11C16/10 |
主分类号 |
G11C29/00 |
代理机构 |
Toler Law Group, PC |
代理人 |
Toler Law Group, PC |
主权项 |
1. A method comprising:
in a data storage device that includes a non-volatile memory, performing:
determining that a current error correction code page count (CEC) value is equal to or larger than a target error correction code page count (TEC) value by comparing the CEC value to the TEC value, wherein the CEC value is a count of error correction code (ECC) pages of data read from the non-volatile memory during a time period from a previous time to a particular time, wherein the data is read using a set of reference voltages; andin response to the CEC value being equal to or larger than the TEC value, updating a subset of the set of reference voltages conditioned upon a difference between a current mean error count (CMEC) and a previous mean error count (PMEC) being at least as large as a target mean delta error (TMDE), wherein the CMEC is based on a count of read errors associated with the data read from the non-volatile memory during the time period. |
地址 |
Plano TX US |