Metal gate structure for semiconductor devices

摘要

Disclosed herein are various embodiments of an improved metal gate structure for semiconductor devices, such as transistors. In one example disclosed herein, a transistor has a gate structure consisting of a gate insulation layer positioned on a semiconducting substrate, a high-k insulation layer positioned on the gate insulation layer, a layer of titanium nitride positioned on the high-k insulation layer, a layer of aluminum positioned on the layer of titanium nitride and a layer of polysilicon positioned on the layer of aluminum.

主权项

1. A transistor formed in and above a semiconducting substrate, said transistor having a gate structure consisting of:
a silicon dioxide gate insulation layer positioned on said semiconducting substrate, said silicon dioxide gate insulation layer having a thickness of about 1 nm; a single layer of hafnium oxide or hafnium silicate positioned on said silicon dioxide gate insulation layer, said single layer of hafnium oxide or hafnium silicate having a thickness of about 1.7 nm; a layer of titanium nitride positioned on said layer of hafnium oxide or hafnium silicate, said layer of titanium nitride having a thickness of about 2 nm; a layer of aluminum positioned on said layer of titanium nitride; and a layer of polysilicon positioned on said layer of aluminum.