发明名称 METHODS FOR PERFORMING MODEL-BASED LITHOGRAPHY GUIDED LAYOUT DESIGN
摘要 Methods are disclosed to create efficient model-based Sub-Resolution Assist Features (MB-SRAF). An SRAF guidance map is created, where each design target edge location votes for a given field point on whether a single-pixel SRAF placed on this field point would improve or degrade the aerial image over the process window. In one embodiment, the SRAF guidance map is used to determine SRAF placement rules and/or to fine-tune already-placed SRAFs. The SRAF guidance map can be used directly to place SRAFs in a mask layout. Mask layout data including SRAFs may be generated, wherein the SRAFs are placed according to the SRAF guidance map. The SRAF guidance map can comprise an image in which each pixel value indicates whether the pixel would contribute positively to edge behavior of features in the mask layout if the pixel is included as part of a sub-resolution assist feature.
申请公布号 US2014317580(A1) 申请公布日期 2014.10.23
申请号 US201414282754 申请日期 2014.05.20
申请人 ASML NETHERLANDS B.V. 发明人 YE Jun;Cao Yu;Feng Hanying
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A method for determining location of one or more features within a mask layout, comprising: placing a first feature in the mask layout; performing a mask simulation based on the placement of the first feature, wherein performing the mask simulation includes generating an SRAF guidance map; and determining a location for placing a second feature in the mask layout based on results obtained from the simulation.
地址 Veldhoven NL