发明名称 |
POWER SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A power semiconductor device may include: abase substrate including a first conductive type drift layer; a second conductive type semiconductor substrate disposed on the other surface of the base substrate; a first conductive type diffusion layer disposed in the base substrate and having an impurity concentration higher than that of the drift layer; a second conductive type well layer disposed inside of one surface of the base substrate; a trench formed from one surface of the base substrate including the well layer so as to penetrate through the diffusion layer in a depth direction; a first insulation film disposed on a surface of the base substrate; and a first electrode disposed in the trench. A peak point of an impurity doping concentration of the diffusion layer in a transverse direction may be positioned in a region contacting a side surface of the trench. |
申请公布号 |
US2014312383(A1) |
申请公布日期 |
2014.10.23 |
申请号 |
US201414322346 |
申请日期 |
2014.07.02 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
SONG In Hyuk;Park Jae Hoon;Seo Dong Soo;Jang Chang Su |
分类号 |
H01L29/739;H01L29/66 |
主分类号 |
H01L29/739 |
代理机构 |
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代理人 |
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主权项 |
1. A power semiconductor device comprising:
a base substrate having one surface and an other surface opposing the one surface and comprising a first conductive type drift layer; a second conductive type semiconductor substrate disposed on the other surface of the base substrate; a first conductive type diffusion layer disposed in the base substrate and having an impurity concentration higher than that of the drift layer; a second conductive type well layer disposed under the one surface of the base substrate; a trench formed from the one surface of the base substrate including the well layer so as to penetrate through the diffusion layer in a first direction; an insulation film disposed on the one surface of the base substrate including an inner wall of the trench; and a first electrode disposed in the trench, wherein a peak point of an impurity doping concentration of the diffusion layer in a second direction perpendicular to the first direction is positioned in a region contacting a side surface of the trench. |
地址 |
Suwon-Si KR |