发明名称 |
Methods for forming semiconductor structures using selectively-formed sidewall spacers |
摘要 |
Methods for forming semiconductor structures using selectively-formed sidewall spacers are provided. In one method, a first structure and a second structure is formed. The second structure has a height that is greater than the first structure's height. A first sidewall spacer-forming material is deposited overlying the first structure and the second structure. A second sidewall spacer-forming material is deposited overlying the first sidewall spacer-forming material. A composite spacer is formed about the second structure, the composite spacer comprising the first sidewall spacer-forming material and the second sidewall spacer-forming material. The second sidewall spacer-forming material is removed from the first structure and the first sidewall spacer-forming material is removed from the first structure. |
申请公布号 |
US8865596(B2) |
申请公布日期 |
2014.10.21 |
申请号 |
US201313755807 |
申请日期 |
2013.01.31 |
申请人 |
Globalfoundries, Inc. |
发明人 |
Johnson Frank Scott |
分类号 |
H01L21/311;H01L21/308;H01L29/66;H01L21/84 |
主分类号 |
H01L21/311 |
代理机构 |
Ingrassia Fisher & Lorenz, P.C. |
代理人 |
Ingrassia Fisher & Lorenz, P.C. |
主权项 |
1. A method for forming a semiconductor structure, the method comprising the steps of:
forming a first structure overlying a semiconductor substrate, wherein the first structure has a first height; forming a second structure overlying the semiconductor substrate, wherein the second structure has a second height and wherein the second height is greater than the first height; depositing a first sidewall spacer-forming material overlying the first structure and the second structure; depositing a second sidewall spacer-forming material overlying the first sidewall spacer-forming material, wherein the second sidewall spacer-forming material has an etch rate when subjected to an etchant that is different from an etch rate of the first sidewall spacer-forming material when subjected to the same etchant; etching the first sidewall spacer-forming material and the second sidewall spacer-forming material until a composite spacer is formed about the second structure, the composite spacer comprising the first sidewall spacer-forming material and the second sidewall spacer-forming material; at least substantially removing the second sidewall spacer-forming material from the first structure; and at least substantially removing the first sidewall spacer-forming material from the first structure, wherein the step of etching to form the composite spacer comprises forming about the second structure a composite spacer having a width that is greater than a width of a composite spacer formed about the first structure. |
地址 |
Grand Cayman KY |