发明名称 |
Semiconductor devices and methods of manufacture thereof |
摘要 |
Semiconductor devices and methods of manufacture thereof are disclosed. In one embodiment, a method of manufacturing a semiconductor device includes forming a channel region in a workpiece, and forming a source or drain region proximate the channel region. The source or drain region includes a contact resistance-lowering material layer comprising SiP, SiAs, or a silicide. The source or drain region also includes a channel-stressing material layer comprising SiCP or SiCAs. |
申请公布号 |
US8866188(B1) |
申请公布日期 |
2014.10.21 |
申请号 |
US201414322298 |
申请日期 |
2014.07.02 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Tsai Ji-Yin;Huang Yao-Tsung;Ko Chih-Hsin;Wann Clement |
分类号 |
H01L21/02;H01L27/088 |
主分类号 |
H01L21/02 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. A device comprising:
a channel region in a substrate; a gate structure on the substrate over the channel region; source and drain regions in the substrate on opposing sides of the channel region, the source and drain regions comprising:
a first conformal liner having a first material composition along bottom surface of the source and drain regions;a second conformal liner having a second material composition on sidewalls of the source and drain regions;a silicon-containing material adjoining the first and second conformal liners; anda carbon-containing material disposed on the silicon-containing material. |
地址 |
Hsin-Chu TW |