发明名称 Semiconductor devices and methods of manufacture thereof
摘要 Semiconductor devices and methods of manufacture thereof are disclosed. In one embodiment, a method of manufacturing a semiconductor device includes forming a channel region in a workpiece, and forming a source or drain region proximate the channel region. The source or drain region includes a contact resistance-lowering material layer comprising SiP, SiAs, or a silicide. The source or drain region also includes a channel-stressing material layer comprising SiCP or SiCAs.
申请公布号 US8866188(B1) 申请公布日期 2014.10.21
申请号 US201414322298 申请日期 2014.07.02
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Tsai Ji-Yin;Huang Yao-Tsung;Ko Chih-Hsin;Wann Clement
分类号 H01L21/02;H01L27/088 主分类号 H01L21/02
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A device comprising: a channel region in a substrate; a gate structure on the substrate over the channel region; source and drain regions in the substrate on opposing sides of the channel region, the source and drain regions comprising: a first conformal liner having a first material composition along bottom surface of the source and drain regions;a second conformal liner having a second material composition on sidewalls of the source and drain regions;a silicon-containing material adjoining the first and second conformal liners; anda carbon-containing material disposed on the silicon-containing material.
地址 Hsin-Chu TW