发明名称 |
IMPRINT LITHOGRAPHY EQUIPMENT WITH SELF-ALIGNMENT FUNCTION OF CONTACTING SURFACE AND METHOD OF IMPRINTING LITHOGRAPHY FOR USING THE SAME |
摘要 |
<p>The present invention relates to a self-alignment imprint lithography apparatus and an imprint lithography method using the same. More particularly, the present invention relates to a self-alignment imprint lithography apparatus which arranges the position of a substrate in parallel to the contact surface of a stamp to apply a force to the entire region of the substrate with uniform pressure distribution when the stamp is in contact with the substrate fixed by a substrate chuck in an imprint lithography process, and an imprint lithography method using the same.</p> |
申请公布号 |
KR20140122983(A) |
申请公布日期 |
2014.10.21 |
申请号 |
KR20130040151 |
申请日期 |
2013.04.11 |
申请人 |
KOREA INSTITUTE OF MACHINERY & MATERIALS |
发明人 |
CHOI, KEE BONG;LEE, JAE JONG;KIM, GEE HONG;LIM, HYUNG JUN |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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