发明名称 IMPRINT LITHOGRAPHY EQUIPMENT WITH SELF-ALIGNMENT FUNCTION OF CONTACTING SURFACE AND METHOD OF IMPRINTING LITHOGRAPHY FOR USING THE SAME
摘要 <p>The present invention relates to a self-alignment imprint lithography apparatus and an imprint lithography method using the same. More particularly, the present invention relates to a self-alignment imprint lithography apparatus which arranges the position of a substrate in parallel to the contact surface of a stamp to apply a force to the entire region of the substrate with uniform pressure distribution when the stamp is in contact with the substrate fixed by a substrate chuck in an imprint lithography process, and an imprint lithography method using the same.</p>
申请公布号 KR20140122983(A) 申请公布日期 2014.10.21
申请号 KR20130040151 申请日期 2013.04.11
申请人 KOREA INSTITUTE OF MACHINERY & MATERIALS 发明人 CHOI, KEE BONG;LEE, JAE JONG;KIM, GEE HONG;LIM, HYUNG JUN
分类号 H01L21/027 主分类号 H01L21/027
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