发明名称 |
Semiconductor device and method for manufacturing the same |
摘要 |
It is an object of the present invention to provide a technique in which a high-performance and high reliable memory device and a semiconductor device provided with the memory device are manufactured at low cost with high yield. The semiconductor device includes an organic compound layer including an insulator over a first conductive layer and a second conductive layer over the organic compound layer including an insulator. Further, the semiconductor device is manufactured by forming a first conductive layer, discharging a composition of an insulator and an organic compound over the first conductive layer to form an organic compound layer including an insulator, and forming a second conductive layer over the organic compound layer including an insulator. |
申请公布号 |
US8865511(B2) |
申请公布日期 |
2014.10.21 |
申请号 |
US201113295304 |
申请日期 |
2011.11.14 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Yukawa Mikio;Ohsawa Nobuharu;Nomura Ryoji;Asami Yoshinobu |
分类号 |
H01L35/24;H01L51/00;H01L27/28;H01L51/05;G11C13/00;B82Y10/00 |
主分类号 |
H01L35/24 |
代理机构 |
Robinson Intellectual Property Law Office, P.C. |
代理人 |
Robinson Eric J.;Robinson Intellectual Property Law Office, P.C. |
主权项 |
1. A method for manufacturing a semiconductor device, comprising the steps of:
forming a first conductive layer; forming an organic compound layer comprising an insulator over the first conductive layer; and forming a second conductive layer over the organic compound layer, wherein the organic compound layer comprises a plurality of insulating particles dispersed in the organic compound layer. |
地址 |
Atsugi-shi, Kanagawa-ken JP |