发明名称 Semiconductor device and method for manufacturing the same
摘要 It is an object of the present invention to provide a technique in which a high-performance and high reliable memory device and a semiconductor device provided with the memory device are manufactured at low cost with high yield. The semiconductor device includes an organic compound layer including an insulator over a first conductive layer and a second conductive layer over the organic compound layer including an insulator. Further, the semiconductor device is manufactured by forming a first conductive layer, discharging a composition of an insulator and an organic compound over the first conductive layer to form an organic compound layer including an insulator, and forming a second conductive layer over the organic compound layer including an insulator.
申请公布号 US8865511(B2) 申请公布日期 2014.10.21
申请号 US201113295304 申请日期 2011.11.14
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Yukawa Mikio;Ohsawa Nobuharu;Nomura Ryoji;Asami Yoshinobu
分类号 H01L35/24;H01L51/00;H01L27/28;H01L51/05;G11C13/00;B82Y10/00 主分类号 H01L35/24
代理机构 Robinson Intellectual Property Law Office, P.C. 代理人 Robinson Eric J.;Robinson Intellectual Property Law Office, P.C.
主权项 1. A method for manufacturing a semiconductor device, comprising the steps of: forming a first conductive layer; forming an organic compound layer comprising an insulator over the first conductive layer; and forming a second conductive layer over the organic compound layer, wherein the organic compound layer comprises a plurality of insulating particles dispersed in the organic compound layer.
地址 Atsugi-shi, Kanagawa-ken JP