发明名称 |
Integrated visible and infrared imager devices and associated methods |
摘要 |
Semiconductor devices having three dimensional (3D) architectures and methods form making such devices are provided. In one aspect, for example, a method for making a semiconductor device can include forming a device layer on a front side of a semiconductor layer that is substantially defect free, bonding a carrier substrate to the device layer, processing the semiconductor layer on a back side opposite the device layer to form a processed surface, and bonding a smart substrate to the processed surface. In some aspects, the method can also include removing the carrier substrate from the semiconductor layer to expose the device layer. |
申请公布号 |
US8865507(B2) |
申请公布日期 |
2014.10.21 |
申请号 |
US201213712865 |
申请日期 |
2012.12.12 |
申请人 |
SiOnyx, Inc. |
发明人 |
Haddad Homayoon;Forbes Leonard |
分类号 |
H01L21/00;H01L31/0236;H01L31/18;H01L27/146 |
主分类号 |
H01L21/00 |
代理机构 |
Thorpe North & Western LLP |
代理人 |
Thorpe North & Western LLP |
主权项 |
1. A method for making a semiconductor device, comprising:
forming a device layer on a front side of a semiconductor layer, wherein the semiconductor layer is at least substantially defect free; bonding a carrier substrate to the device layer; processing the semiconductor layer on a back side opposite the device layer to form a processed surface; and coupling a bolometer to the processed surface. |
地址 |
Beverly MA US |