IMPLEMENTING EDIT AND UPDATE FUNCTIONALITY WITHIN A DEVELOPMENT ENVIRONMENT USED TO COMPILE TEST PLANS FOR AUTOMATED SEMICONDUCTOR DEVICE TESTING

摘要

A method for debugging test procedures for automated device testing is disclosed. The method comprises receiving a command to update at least one modified test procedure modified during a first debugging session and saving state information for a test plan, wherein the state information comprises information regarding a breakpoint entry location, and wherein the modified test procedure is invoked within the test plan. The method subsequently comprises suspending execution of the test plan and unloading the modified test procedure. It also comprises compiling the modified test procedure to produce a compiled file and then reloading the test procedure into the test plan using the compiled file. Finally, it comprises resuming execution of the modified test procedure in a second debugging session and breaking the execution during the second debugging session at a breakpoint corresponding to the breakpoint entry location.

主权项

1. A method for debugging test procedures for automated device testing, said method comprising:
receiving a command to update at least one modified test procedure modified during a first debugging session; saving state information for a test plan, wherein said state information comprises information regarding a breakpoint entry location, and wherein said modified test procedure is invoked within said test plan; suspending execution of said test plan; unloading said modified test procedure from said test plan; compiling said modified test procedure to produce a compiled file associated with said modified test procedure; reloading said modified test procedure into said test plan using said compiled file; resuming execution of said modified test procedure in a second debugging session; and breaking said execution during said second debugging session at a breakpoint corresponding to said breakpoint entry location.