| 发明名称 |
SCAN COMPRESSION RATIO BASED ON FAULT DENSITY |
| 摘要 |
A processor-implemented method for determining scan compression ratio based on fault density is provided. The processor-implemented method may include calculating, by a processor, a fault density value for each of a plurality of partitions of an integrated circuit. The fault density is computed by the processor based on a ratio of a total number of faults per partition to a total number of flip-flops per partition. The processor-implemented method further includes the processor determining a compression ratio for each of the plurality of partitions based on the fault density value for each of the plurality of partitions and applying the compression ratio to each of the plurality of the partitions of the integrated circuit. |
| 申请公布号 |
US2014310565(A1) |
申请公布日期 |
2014.10.16 |
| 申请号 |
US201313861427 |
申请日期 |
2013.04.12 |
| 申请人 |
CORPORATION INTERNATIONAL BUSINESS MACHINES |
发明人 |
Bhagat Hardik;Konda Baalaji R. |
| 分类号 |
G01R31/3177 |
主分类号 |
G01R31/3177 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A processor-implemented method for determining scan compression ratio based on fault density, the method comprising:
calculating a fault density value for each of a plurality of partitions of an integrated circuit, wherein the fault density is computed based on a ratio of a total number of faults per partition to a total number of flip-flops per partition; and determining a compression ratio for each of the plurality of partitions based on the calculated fault density value for each of the plurality of partitions. |
| 地址 |
US |
