| 发明名称 |
METHODS OF USING TEMPERATURE CONTROL DEVICES IN ELECTRON MICROSCOPY |
| 摘要 |
<p>Methods of using temperature control devices in electron microscopes. The temperature of the device structure may be controlled to extract information about reactions and processes that was previously unobtainable.</p> |
| 申请公布号 |
EP2481073(A4) |
申请公布日期 |
2014.10.15 |
| 申请号 |
EP20100819425 |
申请日期 |
2010.09.23 |
| 申请人 |
PROTOCHIPS, INC. |
发明人 |
DAMIANO, JOHN;MICK, STEPHEN;NACKASHI, DAVID |
| 分类号 |
H01J37/26;H01J37/20;H01J37/244 |
主分类号 |
H01J37/26 |
| 代理机构 |
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