发明名称 Method and system for controlling chip inclination during flip-chip mounting
摘要 A method for alignment of a first substrate coupled to a second substrate includes determining an inclination angle for the first substrate or the second substrate due to warpage. The method includes determining a joint height difference based on the inclination angle and configuring a size for one or more bond pads based on the joint height difference.
申请公布号 US8859335(B2) 申请公布日期 2014.10.14
申请号 US201213667727 申请日期 2012.11.02
申请人 Fujitsu Limited 发明人 Lee Michael G.;Uchibori Chihiro
分类号 H01L21/00 主分类号 H01L21/00
代理机构 Baker Botts L.L.P. 代理人 Baker Botts L.L.P.
主权项 1. A method for alignment of a first substrate coupled to a second substrate, comprising: determining an inclination angle for the first substrate or the second substrate due to warpage; determining a joint height difference based on the inclination angle; and configuring a size for one or more bond pads based on the joint height difference.
地址 Kawasaki-shi JP