INFORMATION PROCESSING APPARATUS AND APPARATUS FOR EVALUATING WHETHER AN INFORMATION PROCESSING METHOD IS POSSIBLE

摘要

An information processing apparatus using a design and evaluation method for a device or an apparatus concerning microscopic particles in conformity with dual mechanics is provided, and this apparatus may be utilized as an evaluation apparatus for evaluating whether or not quantum computers can be realized; wherein the dual mechanics is universal mechanics constructed by combining classical mechanics and novel wave mechanics and may be applicable to all particles ranging from microscopic to macroscopic particles. As a result, it is possible to prevent making useless efforts for realizing quantum computers that are judged to be impossible to realize and to pitch those efforts that might be wasted on the above realization into developing other effective technologies.

主权项

1. An information processing apparatus for evaluating the function of a device or an apparatus concerning each of individual microscopic massive particles comprising:
an analyzer using at least a statistical wave function defined as an evaluation function for evaluating the function of said device or apparatus concerning said microscopic particles; and an outputer for outputting evaluation result obtained by said analyzer, wherein said statistical wave function represents at least one state of an ensemble of said microscopic particles, wherein said device or apparatus concerning said microscopic particles comprises: a beam generator for generating a beam containing said microscopic particles; a restrictor for restricting a path for the beam generated by said beam generator to be narrower; a wave guide for guiding a beam passed through said restrictor; anda detector having a detection surface for detecting particles included in said beam arrived through a wave guiding path of said wave guide, wherein said analyzer evaluates performance of said wave guide for wave guiding by calculating the spread of particles included in said beam on said detection surface using a statistical de Broglie wave representing the beam incident on said restrictor as said statistical wave function.