发明名称 METHODS AND SYSTEMS FOR APPLYING END CAP DC BIAS IN ION TRAPS
摘要 A mass spectrometer for analyzing a sample utilizing an ion trap comprises an entrance end cap defining an entrance aperture configured to receive the sample entering the ion trap; a ring electrode defining a ring cavity configured to generate, based on a radio frequency (RF) voltage applied to the ring electrode, an electric field configured to trap the sample received through the entrance aperture; an exit end cap defining an exit aperture configured to receive sample ions exiting the ion trap; and an end cap controller configured to generate a bias control voltage for applying a DC bias potential to at least one of the entrance end or the exit end cap, wherein a value of the bias control voltage is based on an operational parameter of the mass spectrometer.
申请公布号 WO2014163940(A2) 申请公布日期 2014.10.09
申请号 WO2014US19085 申请日期 2014.02.27
申请人 1ST DETECT CORPORATION 发明人 RAFFERTY, DAVID
分类号 H01J49/36;H01J49/00 主分类号 H01J49/36
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