发明名称 (Al,Ga,In)N DIODE LASER FABRICATED AT REDUCED TEMPERATURE
摘要 A method of fabricating an (Al,Ga,In)N laser diode, comprising depositing one or more III-N layers upon a growth substrate at a first temperature, depositing an indium containing laser core at a second temperature upon layers deposited at a first temperature, and performing all subsequent fabrication steps under conditions that inhibit degradation of the laser core, wherein the conditions are a substantially lower temperature than the second temperature.
申请公布号 US2014301419(A1) 申请公布日期 2014.10.09
申请号 US201414308445 申请日期 2014.06.18
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 Cohen Daniel A.;DenBaars Steven P.;Nakamura Shuji
分类号 H01S5/30;H01S5/20;H01S5/22 主分类号 H01S5/30
代理机构 代理人
主权项 1. A method of fabricating a III-Nitride diode laser, the method comprising: forming a III-Nitride layer on or above a growth substrate, wherein the III-Nitride layer is formed, using at least deposition, at a first temperature, and wherein the III-Nitride layer comprises an indium-containing active region; and performing at least one subsequent fabrication process at a second temperature that is lower than the first temperature to inhibit degradation of the indium-containing active region, wherein the subsequent fabrication process comprise forming a conducting oxide waveguide or cladding layer on or above the III-Nitride layers at the second temperature.
地址 Oakland CA US