发明名称 |
Flash memory device and reading method thereof |
摘要 |
A flash memory device and reading method of the flash memory device. The reading method includes determining a read voltage set of memory cells corresponding to a first word line from at least one of flag cell data of the first word line and flag cell data of a second word line adjacent to the first word line, and reading the memory cells corresponding to the first word line according to the determined read voltage set. |
申请公布号 |
US8854889(B2) |
申请公布日期 |
2014.10.07 |
申请号 |
US201313954428 |
申请日期 |
2013.07.30 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Kim Boh-chang |
分类号 |
G11C11/34;G11C16/04;G11C11/26;G11C11/56 |
主分类号 |
G11C11/34 |
代理机构 |
Lee & Morse, P.C. |
代理人 |
Lee & Morse, P.C. |
主权项 |
1. A method of reading a flash memory device, the method comprising:
determining whether a Nth word line (N is a natural number) is a finally written word line; selecting a first read voltage set as a read voltage set for memory cells of the Nth word line, when the Nth word line is not the finally written word line, and selecting a second read voltage set as the read voltage set for the memory cells of the Nth word line, when the Nth word line is the finally written word line; and reading the memory cells of the Nth word line according to the selected read voltage set. |
地址 |
Suwon-si, Gyeonggi-do KR |