发明名称 Ionization apparatus and ionization analysis apparatus
摘要 A sampling nozzle 21, an ion supply tube 31 leading to an analysis apparatus 50 and a barrier discharge tube 11 are connected to first, second and third ends, respectively, of a T-shaped tube 41 having three connecting ports, and the central portion of the T-shaped tube is an ionization chamber SP. The ionization chamber SP is a closed space, and ions generated therein are introduced to the analysis apparatus 50 through the ion supply tube 31. As a result, almost all of the ions are introduced into the interior of the analysis apparatus.
申请公布号 US8853626(B2) 申请公布日期 2014.10.07
申请号 US201414172400 申请日期 2014.02.04
申请人 University of Yamanashi 发明人 Hiraoka Kenzo;Chen Lee Chuin
分类号 H01J49/10;H01J49/00;H01J27/00;G01N27/68;H01J49/14;H05H1/24 主分类号 H01J49/10
代理机构 Morgan, Lewis & Bockius LLP 代理人 Morgan, Lewis & Bockius LLP
主权项 1. An ionization apparatus comprising: a barrier discharge tube portion; a sample introducing tube portion; an ion supply tube portion; and an ionization chamber comprising an ionization chamber wall; wherein said barrier discharge tube portion has a portion formed by a dielectric material and is equipped with an outer electrode and an inner electrode that are disposed respectively on an outer circumferential surface side of and internally of the dielectric portion; said sample introducing tube portion contains a sample introducing port that leads to the external environment; said ionization chamber is a closed space, wherein the ionization chamber is located forward of said barrier discharge tube portion and is directed toward one end of the ion supply tube portion from the other end of said sample introducing tube portion, by said ionization chamber wall; and said ion supply tube portion has an ion supply port, which leads to the analysis apparatus, at the other end thereof.
地址 Yamanashi JP