发明名称 Semiconductor memory device and method for manufacturing the same
摘要 The present technology includes a semiconductor memory device and a method of manufacturing the same. The semiconductor device includes insulation patterns and cell word lines alternately stacked on a substrate. A cell channel layer is formed through the insulation patterns and the cell word lines. A select channel layer is connected to the cell channel layer, and the select channel layer has a resistance higher than a resistance of the cell channel layer. A select line surrounds the select channel layer.
申请公布号 US8854855(B2) 申请公布日期 2014.10.07
申请号 US201313830594 申请日期 2013.03.14
申请人 SK Hynix Inc. 发明人 Jung Sung Wook;Oh Jung Seok
分类号 G11C5/06;H01L21/28 主分类号 G11C5/06
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A semiconductor memory device, comprising: insulation patterns and cell word lines alternately stacked on a substrate; cell channel layers formed through the insulation patterns and the cell word lines; select channel layers connected to the cell channel layers, the select channel layers each having a resistance higher than a resistance of each of the cell channel layers; and select lines surrounding the select channel layers.
地址 Gyeonggi-Do KR