发明名称 |
Semiconductor memory device and method for manufacturing the same |
摘要 |
The present technology includes a semiconductor memory device and a method of manufacturing the same. The semiconductor device includes insulation patterns and cell word lines alternately stacked on a substrate. A cell channel layer is formed through the insulation patterns and the cell word lines. A select channel layer is connected to the cell channel layer, and the select channel layer has a resistance higher than a resistance of the cell channel layer. A select line surrounds the select channel layer. |
申请公布号 |
US8854855(B2) |
申请公布日期 |
2014.10.07 |
申请号 |
US201313830594 |
申请日期 |
2013.03.14 |
申请人 |
SK Hynix Inc. |
发明人 |
Jung Sung Wook;Oh Jung Seok |
分类号 |
G11C5/06;H01L21/28 |
主分类号 |
G11C5/06 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A semiconductor memory device, comprising:
insulation patterns and cell word lines alternately stacked on a substrate; cell channel layers formed through the insulation patterns and the cell word lines; select channel layers connected to the cell channel layers, the select channel layers each having a resistance higher than a resistance of each of the cell channel layers; and select lines surrounding the select channel layers. |
地址 |
Gyeonggi-Do KR |