发明名称 CHEMICAL MECHANICAL POLISHING PAD AND CHEMICAL MECHANICAL POLISHING METHOD USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide: a chemical mechanical polishing pad exhibiting high polishing speed in CMP and capable of achieving both improvement in flatness of a surface to be polished and reduction in polishing defects (scratches); and a chemical mechanical polishing method using the chemical mechanical polishing pad.SOLUTION: A chemical mechanical polishing pad according to the present invention has a polishing layer which contains (A1) an acrylonitrile-butadiene copolymer and (A2) a vinyl chloride resin, and in which, providing that the sum of the (A1) component and the (A2) component is 100 pts.mass, the content ratios of the (A1) component and the (A2) component are 30-90 pts.mass and 70-10 pts.mass, respectively.
申请公布号 JP2014192217(A) 申请公布日期 2014.10.06
申请号 JP20130064225 申请日期 2013.03.26
申请人 JSR CORP 发明人 SUGIURA KAZUO;TANO HIROYUKI;YOKOI KATSUTAKA;NIIMI MASATSUGU
分类号 H01L21/304;B24B37/24 主分类号 H01L21/304
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