发明名称 SEMICONDUCTOR MEMORY APPARATUS
摘要 A semiconductor memory apparatus includes a resistive memory cell; a data sensing unit configured to sense an output voltage, formed by a sensing current supplied to the resistive memory cell, based on a reference voltage, and output data having a value corresponding to the sensing result; and a reference voltage generation unit comprising a dummy memory cell including first and second resistors having first and second resistance values, respectively, and configured to output a voltage formed by the sensing current supplied to the dummy memory cell as the reference voltage.
申请公布号 US2014293689(A1) 申请公布日期 2014.10.02
申请号 US201414301458 申请日期 2014.06.11
申请人 SK hynix Inc. 发明人 SONG Taek Sang;KWON Dae Han
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项 1. A semiconductor memory apparatus comprising: a resistive memory cell; a first data transmission unit configured to control an amount of current for the resistive memory cell according to a voltage level of a selection signal; a data sensing unit configured to sense a first output voltage formed by a sensing current supplied to the resistive memory cell through the first data transmission unit, based on a reference voltage, and output data having a value corresponding to the sensing result; a dummy memory cell comprising first and second resistors coupled in parallel to each other and having first and second resistance values, respectively; and a second data transmission unit configured to control an amount of current for the dummy memory cell according to the voltage level of the selection signal and output a voltage formed by the sensing current supplied to the dummy memory cell as the reference voltage, wherein the reference voltage has a level in accordance with an intermediate value between the first resistance value and the second resistance value, and the sensing current.
地址 Icheon-si Gyeonggi-do KR