发明名称 RESISTIVE RANDOM ACCESS MEMORY
摘要 Disclosed is a nonvolatile resistive random access memory. The nonvolatile resistive random access memory includes an upper electrode, a lower electrode, an ion supply layer formed on the lower electrode, and a resistance change layer formed on the ion supply layer. The ion supply layer includes copper-doped carbon. A low-power switching operation is performed because the optimal filament is formed by limiting the number of supplied ions, without using the existing method that supplies infinite ions by using a metal electrode.
申请公布号 US2014291598(A1) 申请公布日期 2014.10.02
申请号 US201414227038 申请日期 2014.03.27
申请人 Intellectual Discovery Co., Ltd. 发明人 Hwang Hyun Sang
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项 1. A resistive random access memory (ReRAM) comprising: an upper electrode; a lower electrode; an ion supply layer formed on the lower electrode; and a resistance change layer formed on the ion supply layer, wherein the ion supply layer comprises copper-doped carbon.
地址 Seoul KR