发明名称 Scan Chain Reconfiguration and Repair
摘要 A system includes an integrated circuit. The integrated circuit includes at least one scan chain group. A particular scan chain group of the at least one scan chain group includes at least one scan chain and at least one spare scan chain. The at least one scan chain of the particular scan chain group includes a particular scan chain. The at least one spare scan chain of the particular scan chain group includes a particular spare scan chain. The particular spare scan chain is configured to bypass the particular scan chain.
申请公布号 US2014298123(A1) 申请公布日期 2014.10.02
申请号 US201313852548 申请日期 2013.03.28
申请人 LSI CORPORATION 发明人 Tekumalla Ramesh C.
分类号 G06F11/26 主分类号 G06F11/26
代理机构 代理人
主权项 1. A system, comprising: an integrated circuit, wherein the integrated circuit includes: at least one scan chain group, wherein a particular scan chain group of the at least one scan chain group includes: at least one scan chain, the at least one scan chain including a particular scan chain; andat least one spare scan chain, the at least one spare scan chain including a particular spare scan chain configured to bypass the particular scan chain.
地址 San Jose CA US