发明名称 Asymmetric Spacers
摘要 A semiconductor device having asymmetric spacers and steps for forming the same are disclosed. The spacers have difference capacitances, with the spacer having a higher capacitance formed over a source region of the device and the spacer having a lower capacitance formed over a drain region of the device. Embodiments of the disclosed invention include spacers made from different materials, having different or substantially equal thicknesses.
申请公布号 US2014291761(A1) 申请公布日期 2014.10.02
申请号 US201313853090 申请日期 2013.03.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Cheng Kangguo;Khakifirooz Ali;Wise Richard S.
分类号 H01L21/28;H01L29/423;H01L29/78 主分类号 H01L21/28
代理机构 代理人
主权项 1. A semiconductor device comprising: a gate formed on a top surface of a substrate, the gate having a first sidewall and a second sidewall, the first sidewall positioned opposite the second sidewall; a first spacer formed on and adjacent to the first sidewall of the gate, wherein the first spacer is made of a first material; and a second spacer formed on and adjacent to the second sidewall of the gate, wherein the second spacer is made of a second material different from the first material.
地址 Armonk NY US