发明名称 |
Asymmetric Spacers |
摘要 |
A semiconductor device having asymmetric spacers and steps for forming the same are disclosed. The spacers have difference capacitances, with the spacer having a higher capacitance formed over a source region of the device and the spacer having a lower capacitance formed over a drain region of the device. Embodiments of the disclosed invention include spacers made from different materials, having different or substantially equal thicknesses. |
申请公布号 |
US2014291761(A1) |
申请公布日期 |
2014.10.02 |
申请号 |
US201313853090 |
申请日期 |
2013.03.29 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Cheng Kangguo;Khakifirooz Ali;Wise Richard S. |
分类号 |
H01L21/28;H01L29/423;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
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主权项 |
1. A semiconductor device comprising:
a gate formed on a top surface of a substrate, the gate having a first sidewall and a second sidewall, the first sidewall positioned opposite the second sidewall; a first spacer formed on and adjacent to the first sidewall of the gate, wherein the first spacer is made of a first material; and a second spacer formed on and adjacent to the second sidewall of the gate, wherein the second spacer is made of a second material different from the first material. |
地址 |
Armonk NY US |