发明名称 SUBSTRATE PROCESSING DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND METHOD FOR PROCESSING SUBSTRATE
摘要 The size of a wafer increases with the miniaturization of a semiconductor and the diameter enlargement of the wafer. Therefore, the gas flow supplied also increases compared to the process for a conventional wafer size. Thus, it is difficult to perform exhaust pressure control in the same manner as before. This substrate processing device includes opening and closing valves respectively provided on a plurality of exhaust pipes communicating with a process chamber and a vacuum pump, and a control means for controlling the opening and closing valves, and addresses the diameter enlargement of the wafer by opening and closing the valves and controlling the pressure for each process event.
申请公布号 WO2014157071(A1) 申请公布日期 2014.10.02
申请号 WO2014JP58053 申请日期 2014.03.24
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 TANIYAMA, TOMOSHI
分类号 H01L21/31;C23C16/52;H01L21/205;H01L21/22;H01L21/324 主分类号 H01L21/31
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