发明名称 |
SUBSTRATE PROCESSING DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND METHOD FOR PROCESSING SUBSTRATE |
摘要 |
The size of a wafer increases with the miniaturization of a semiconductor and the diameter enlargement of the wafer. Therefore, the gas flow supplied also increases compared to the process for a conventional wafer size. Thus, it is difficult to perform exhaust pressure control in the same manner as before. This substrate processing device includes opening and closing valves respectively provided on a plurality of exhaust pipes communicating with a process chamber and a vacuum pump, and a control means for controlling the opening and closing valves, and addresses the diameter enlargement of the wafer by opening and closing the valves and controlling the pressure for each process event. |
申请公布号 |
WO2014157071(A1) |
申请公布日期 |
2014.10.02 |
申请号 |
WO2014JP58053 |
申请日期 |
2014.03.24 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
TANIYAMA, TOMOSHI |
分类号 |
H01L21/31;C23C16/52;H01L21/205;H01L21/22;H01L21/324 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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