发明名称 MEASUREMENT APPARATUS
摘要 <p>A measurement apparatus for surface analysis carried out in a gaseous environment such as air comprises a measurement device capable of measuring a contact potential difference between a probe and a surface, and a light source that triggers photoelectric emission from a sample. The apparatus may operate in“dual”photoemission and contact potential difference (CPD) measurement modes.</p>
申请公布号 EP2783205(A1) 申请公布日期 2014.10.01
申请号 EP20130713476 申请日期 2013.02.21
申请人 KP TECHNOLOGY LTD. 发明人 BAIKIE, IAIN
分类号 G01Q60/30;B82Y35/00;G01N27/00 主分类号 G01Q60/30
代理机构 代理人
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