发明名称 Method to construct a 3D semiconductor device
摘要 A method to construct a semiconductor device, the method including: forming a first mono-crystallized semiconductor layer; forming a second mono-crystallized semiconductor layer including mono-crystallized semiconductor transistors; where the second mono-crystallized semiconductor layer overlays the first mono-crystallized semiconductor layer, where the first mono-crystallized semiconductor layer includes an alignment mark and the transistors are aligned to the alignment mark, and where the first mono-crystallized semiconductor layer includes logic circuits, and connecting the logic circuits to an external device using input/output (I/O) circuits, where the input/output (I/O) circuits are constructed on the second mono-crystallized semiconductor layer.
申请公布号 US8846463(B1) 申请公布日期 2014.09.30
申请号 US201313902606 申请日期 2013.05.24
申请人 Monolithic 3D Inc. 发明人 Or-Bach Zvi;Wurman Zeev
分类号 H01L21/84;H01L21/8232 主分类号 H01L21/84
代理机构 代理人
主权项 1. A method to construct a semiconductor device, the method comprising: forming a first layer comprising mono-crystallized semiconductor and first logic circuits; forming a second layer comprising a mono-crystallized semiconductor layer, said second layer overlying said first logic circuits; forming transistors on said second layer; wherein said forming transistors comprises a lithography step, said lithography step comprises an alignment to said first layer, and connecting said first logic circuits to an external device using input/output (I/O) circuits, said input/output (I/O) circuits are constructed on said second mono-crystallized semiconductor layer.
地址 San Jose CA US