发明名称 NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To improve operation performance.SOLUTION: A nonvolatile semiconductor storage device of an embodiment comprises: a ground layer; a laminate formed on the ground layer and having plural electrode layers and plural insulation layers alternately stacked; a first interlayer insulation film formed on the laminate; a gate electrode layer formed on the first interlayer insulation film; a second interlayer insulation film formed on the gate electrode; a semiconductor layer elongated from a top end of the second interlayer insulation film to a bottom end of the laminate; first insulation films each provided between the semiconductor layer and each of the electrode layers; and a second insulation film provided between the semiconductor layer and the gate electrode. The thickness of the semiconductor layer, which is formed above a top end of the gate electrode, is larger than that of the semiconductor layer, which is formed below the top end of the gate electrode.
申请公布号 JP2014183304(A) 申请公布日期 2014.09.29
申请号 JP20130092976 申请日期 2013.04.25
申请人 TOSHIBA CORP 发明人 SATO MITSURU;KITAZAKI SOICHIRO;KATO RYU;KITO TAKASHI;KATSUMATA RYUTA
分类号 H01L27/115;H01L21/336;H01L21/8247;H01L29/788;H01L29/792 主分类号 H01L27/115
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