发明名称 |
NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To improve operation performance.SOLUTION: A nonvolatile semiconductor storage device of an embodiment comprises: a ground layer; a laminate formed on the ground layer and having plural electrode layers and plural insulation layers alternately stacked; a first interlayer insulation film formed on the laminate; a gate electrode layer formed on the first interlayer insulation film; a second interlayer insulation film formed on the gate electrode; a semiconductor layer elongated from a top end of the second interlayer insulation film to a bottom end of the laminate; first insulation films each provided between the semiconductor layer and each of the electrode layers; and a second insulation film provided between the semiconductor layer and the gate electrode. The thickness of the semiconductor layer, which is formed above a top end of the gate electrode, is larger than that of the semiconductor layer, which is formed below the top end of the gate electrode. |
申请公布号 |
JP2014183304(A) |
申请公布日期 |
2014.09.29 |
申请号 |
JP20130092976 |
申请日期 |
2013.04.25 |
申请人 |
TOSHIBA CORP |
发明人 |
SATO MITSURU;KITAZAKI SOICHIRO;KATO RYU;KITO TAKASHI;KATSUMATA RYUTA |
分类号 |
H01L27/115;H01L21/336;H01L21/8247;H01L29/788;H01L29/792 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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