发明名称 |
COMPOSITION FOR FORMING OVERLAY FILM AND METHOD FOR FORMING RESIST PATTERN USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a composition for forming an overlay film, from which a pattern excellent in roughness and a pattern shape can be formed in a pattern forming process by extreme ultraviolet exposure, and to provide a pattern forming method using the composition.SOLUTION: The composition for forming an overlay film comprises a triphenylene derivative having a hydrophilic group and a solvent. The pattern forming method comprises applying the above composition on a resist surface and exposing and developing the resist. The composition further may contain a polymer. |
申请公布号 |
JP2014178573(A) |
申请公布日期 |
2014.09.25 |
申请号 |
JP20130053401 |
申请日期 |
2013.03.15 |
申请人 |
AZ ELECTRONIC MATERIALS MFG CO LTD |
发明人 |
WANG XIAOWEI;OKAYASU TETSUO;GEORG PAWLOWSKI;KINUTA TAKASHI |
分类号 |
G03F7/11;C08F20/12;C08G63/183;H01L21/027 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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