发明名称 COMPOSITION FOR FORMING OVERLAY FILM AND METHOD FOR FORMING RESIST PATTERN USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a composition for forming an overlay film, from which a pattern excellent in roughness and a pattern shape can be formed in a pattern forming process by extreme ultraviolet exposure, and to provide a pattern forming method using the composition.SOLUTION: The composition for forming an overlay film comprises a triphenylene derivative having a hydrophilic group and a solvent. The pattern forming method comprises applying the above composition on a resist surface and exposing and developing the resist. The composition further may contain a polymer.
申请公布号 JP2014178573(A) 申请公布日期 2014.09.25
申请号 JP20130053401 申请日期 2013.03.15
申请人 AZ ELECTRONIC MATERIALS MFG CO LTD 发明人 WANG XIAOWEI;OKAYASU TETSUO;GEORG PAWLOWSKI;KINUTA TAKASHI
分类号 G03F7/11;C08F20/12;C08G63/183;H01L21/027 主分类号 G03F7/11
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