发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device and a method of manufacturing the same, capable of resolving a problem caused by reduction in coupling ratio.SOLUTION: A nonvolatile semiconductor memory device comprises: a memory cell region having a memory cell that has a floating electrode on a gate insulating film and in which a control electrode is laminated on the floating electrode via an inter-electrode insulating film; and a peripheral circuit region having a peripheral element and in which a first polysilicon and a first insulating film are laminated. The floating electrode of the memory cell is configured to contain polysilicon having a P-type impurity. A first introduction layer of carbon (C) or nitrogen (N) is formed in a first upper region where the polysilicon having the P-type impurity is contacted with the inter-electrode insulating film. Carbon (C) or nitrogen (N) is not introduced to at least a part of a region lower than the first introduction layer. With respect to the first polysilicon, a second introduction layer of carbon (C) or nitrogen (N) is formed in a second upper region contacted with the first insulating film. A width of the first introduction layer and that of the second introduction layer are the same as each other in a lamination direction.</p> |
申请公布号 |
JP2014179361(A) |
申请公布日期 |
2014.09.25 |
申请号 |
JP20130050398 |
申请日期 |
2013.03.13 |
申请人 |
TOSHIBA CORP |
发明人 |
SAKAMOTO WATARU;TAKAHASHI KAZUMA;TAKEKIDA HIDEHITO |
分类号 |
H01L21/336;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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