发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES HAVING A METALLISATION LAYER
摘要 A method for manufacturing semiconductor devices is disclosed. In one embodiment a semiconductor substrate having a first surface, a second surface opposite to the first surface and a plurality of semiconductor components is provided. The semiconductor substrate has a device thickness. At least one metallisation layer is formed on the second surface of the semiconductor substrate. The metallisation layer has a thickness which is greater than the device thickness.
申请公布号 US2014284819(A1) 申请公布日期 2014.09.25
申请号 US201414295791 申请日期 2014.06.04
申请人 Infineon Technologies Austria AG 发明人 Zelsacher Rudolf;Ganitzer Paul
分类号 H01L23/00;H01L23/498 主分类号 H01L23/00
代理机构 代理人
主权项 1. A semiconductor device, comprising: a semiconductor chip comprising a first surface and a second surface opposite to the first surface, the semiconductor chip comprising a thickness; and at least one metallisation portion on the second surface of the semiconductor chip, the metallisation portion comprising a thickness greater than the thickness of the semiconductor chip.
地址 Villach AT