发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES HAVING A METALLISATION LAYER |
摘要 |
A method for manufacturing semiconductor devices is disclosed. In one embodiment a semiconductor substrate having a first surface, a second surface opposite to the first surface and a plurality of semiconductor components is provided. The semiconductor substrate has a device thickness. At least one metallisation layer is formed on the second surface of the semiconductor substrate. The metallisation layer has a thickness which is greater than the device thickness. |
申请公布号 |
US2014284819(A1) |
申请公布日期 |
2014.09.25 |
申请号 |
US201414295791 |
申请日期 |
2014.06.04 |
申请人 |
Infineon Technologies Austria AG |
发明人 |
Zelsacher Rudolf;Ganitzer Paul |
分类号 |
H01L23/00;H01L23/498 |
主分类号 |
H01L23/00 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a semiconductor chip comprising a first surface and a second surface opposite to the first surface, the semiconductor chip comprising a thickness; and at least one metallisation portion on the second surface of the semiconductor chip, the metallisation portion comprising a thickness greater than the thickness of the semiconductor chip. |
地址 |
Villach AT |