发明名称 MEMORY CELLS, INTEGRATED DEVICES, AND METHODS OF FORMING MEMORY CELLS
摘要 Some embodiments include integrated devices, such as memory cells. The devices may include chalcogenide material, an electrically conductive material over the chalcogenide material, and a thermal sink between the electrically conductive material and the chalcogenide material. The thermal sink may be of a composition that includes an element in common with the electrically conductive material and includes an element in common with the chalcogenide material. Some embodiments include a method of forming a memory cell. Chalcogenide material may be formed over heater material. Electrically conductive material may be formed over the chalcogenide material. A thermal sink may be formed between the electrically conductive material and the chalcogenide material. The thermal sink may be of a composition that includes an element in common with the electrically conductive material and includes an element in common with the chalcogenide material.
申请公布号 EP2780944(A1) 申请公布日期 2014.09.24
申请号 EP20120850697 申请日期 2012.11.07
申请人 MICRON TECHNOLOGY, INC. 发明人 REDAELLI, ANDREA;PIROVANO, AGOSTINO;RUSSO, UGO;LAVIZZARI, SIMONE
分类号 H01L45/00 主分类号 H01L45/00
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