发明名称 Plasma etching unit
摘要 The present invention is a plasma etching method including: an arranging step of arranging a pair of electrodes oppositely in a chamber and making one of the electrodes support a substrate to be processed in such a manner that the substrate is arranged between the electrodes, the substrate having an organic-material film and an inorganic-material film; and an etching step of applying a high-frequency electric power to at least one of the electrodes to form a high-frequency electric field between the pair of the electrodes, supplying a process gas into the chamber to form a plasma of the process gas by means of the electric field, and selectively plasma-etching the organic-material film of the substrate with respect to the inorganic-material film by means of the plasma; wherein a frequency of the high-frequency electric power applied to the at least one of the electrodes is 50 to 150 MHz in the etching step.
申请公布号 US8840753(B2) 申请公布日期 2014.09.23
申请号 US200912578007 申请日期 2009.10.13
申请人 Tokyo Electron Limited;Kabushiki Kaisha Toshiba 发明人 Honda Masanobu;Nagaseki Kazuya;Inazawa Koichiro;Matsuyama Shoichiro;Hayashi Hisataka
分类号 H01L21/306;C23C16/50;C23C16/00;H01L21/311;H01L21/768;H01J37/32 主分类号 H01L21/306
代理机构 Smith, Gambrell & Russell LLP 代理人 Smith, Gambrell & Russell LLP
主权项 1. A plasma etching unit for selectively plasma-etching an organic-material film of a substrate having the organic-material film and an inorganic-material thereon while using the inorganic-material film to function as a mask, said unit comprising: a chamber configured to contain the substrate to be processed, first and second electrodes oppositely arranged in the chamber, the second electrode being configured to support the substrate to be processed, a process-gas supplying system configured to supply a process gas into the chamber, a gas-discharging system configured to discharge a gas in the chamber, and a first high-frequency electric power source configured to supply a high-frequency electric power of 50 MHz to 150 MHz for forming a plasma to the second electrode, a second high-frequency electric power source configured to apply a second high-frequency electric power of 500 kHz to 27 MHz to the second electrode, the second high-frequency electric power being overlapped with the first high-frequency electric power, and a magnetic-field forming unit configured to form a magnetic field around a plasma region between the first and second electrodes, the magnetic-field forming unit consisting of a magnetic annular unit having a plurality of synchronously and oppositely rotatable segment magnets concentrically arranged around the chamber such that magnetic-pole directions of adjacent segment magnets are opposite, and each segment magnet is vertically bisected into two associated magnets to define an upper set of annularly arranged magnets and a lower set of annularly arranged magnets, and each associated upper magnet and lower magnet are vertically moveable with respect to each other in order to set a vertical gap therebetween.
地址 Tokyo JP