发明名称 |
Test solution for ring oscillators |
摘要 |
A method and apparatus is disclosed herein for testing of multiple ring oscillators. In one embodiment, the apparatus comprises at least one ring oscillator structure having a ring oscillator having an inverter chain with an odd number of inverters connected back-to-back and operable to produce an oscillatory output, and a test structure coupled to provide either an observability chain input or a test input to the ring oscillator and to receive the oscillatory output as a feedback from the ring oscillator. |
申请公布号 |
US8841974(B2) |
申请公布日期 |
2014.09.23 |
申请号 |
US201213605708 |
申请日期 |
2012.09.06 |
申请人 |
Silicon Image, Inc. |
发明人 |
Sul Chinsong;Kwon Hyukyong;Ng Andy |
分类号 |
H03K3/03 |
主分类号 |
H03K3/03 |
代理机构 |
Fenwick & West LLP |
代理人 |
Fenwick & West LLP |
主权项 |
1. An apparatus comprising at least one ring oscillator structure, the ring oscillator structure comprising:
a ring oscillator having an inverter chain with an odd number of inverters connected serially, the ring oscillator operable to produce an oscillatory output responsive to receiving an oscillatory input; and a test structure coupled to the ring oscillator and configured to validate producing of an intended oscillating frequency of the oscillatory output within a specified jitter limit by the ring oscillator based on an observability chain input or a test input received at the test structure and oscillatory output received as a feedback signal from the ring oscillator, the observability chain input representing a signal for observing faults associated with enabling or disabling the feedback signal to the ring oscillator, the test input representing an input signal with the intended oscillating frequency. |
地址 |
Sunnyvale CA US |