发明名称 Method of controlling illumination apparatus
摘要 A method of controlling an illumination apparatus includes a malfunction detecting step for detecting a malfunction of an organic electroluminescence element based on its electrical characteristic, a short-circuit malfunction restoration step for applying a short-circuit malfunction restoration pulse to an element that is determined to be a short-circuit malfunction, a short-circuit malfunction restoration determination step for determining whether the element that is determined to be the short-circuit malfunction is restored, a malfunctioning element determination step for storing into a storage, when an element that is determined to be the short-circuit malfunction is not restored, individual information including identification information on the element as a malfunctioning element, and a turn-on control step for controlling the turn-on state of a light-emitting surface based on a state of distribution of the malfunctioning organic electroluminescence elements.
申请公布号 US8841848(B2) 申请公布日期 2014.09.23
申请号 US201313781831 申请日期 2013.03.01
申请人 Mitsubishi Chemical Corporation 发明人 Ogata Tomoyuki;Tanamura Mitsuru;Ito Hiroshi
分类号 G09G3/10;H05B33/08;H05B37/03 主分类号 G09G3/10
代理机构 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A method of controlling an illumination apparatus in which a light-emitting surface is formed by a single light-emitting panel or a plurality of light-emitting panels having a plurality of organic electroluminescence elements with different emission colors arranged in a stripe shape, the method comprising: a malfunction detection step of detecting a malfunction of each of the organic electroluminescence elements based on an electrical characteristic of the organic electroluminescence element; a short-circuit malfunction restoration step of performing short-circuit malfunction restoration processing on an element which is determined to be a short-circuit malfunction in the malfunction detection step; a short-circuit malfunction restoration determination step of determining whether or not the element which is determined to be the short-circuit malfunction is restored after the short-circuit malfunction restoration step; a malfunctioning element determination step of, when it is determined in the short-circuit malfunction restoration determination step that the element which is determined to be the short-circuit malfunction is not restored, repeating the short-circuit malfunction restoration step and the short-circuit malfunction restoration determination step, and when the number of determinations that the element which is determined to be the short-circuit malfunction is not restored exceeds a predetermined number of times, storing individual information including identification information of the element as a malfunctioning element in a storage; and a turn-on control step of controlling a turn-on state of the light-emitting surface based on a state of distribution of malfunctioning elements whose individual information is stored in the malfunctioning element determination step.
地址 Chiyoda-ku JP