摘要 |
PROBLEM TO BE SOLVED: To provide a workpiece recognition method that can calculate a position of a workpiece in a complexly overlapped state and a posture thereof with high reliability.SOLUTION: A preparation process is configured to: measure a workpiece W by a contactless type scanner 12; calculate point group data on the workpiece W in each posture; divide the point group data into a plurality of sample patches; classify the point group data for each sample patch; and store reference position information on the workpiece W and posture information thereon in association with each other for each of the plurality of sample patches. A workpiece estimation process is configured to: divide point group data obtained by measuring a plurality of workpieces W by the scanner 12 to patches; classify the patches; and integrate the position information and posture information stored in association with the sample patch of the same classification for each patch; and estimate a reference position of the workpiece in the patch and a posture thereof on the basis of an integration result. |