发明名称 |
BEAM POSITION CONTROL FOR AN EXTREME ULTRAVIOLET LIGHT SOURCE |
摘要 |
A system for an extreme ultraviolet light source includes one or more optical elements positioned to receive a reflected amplified light beam and to direct the reflected amplified light beam into first, second, and third channels, the reflected amplified light beam including a reflection of at least a portion of an irradiating amplified light beam that interacts with a target material; a first sensor that senses light from the first channel; a second sensor that senses light from the second channel and the third channel, the second sensor having a lower acquisition rate than the first sensor; and an electronic processor coupled to a computer-readable storage medium, the medium storing instructions that, when executed, cause the processor to: receive data from the first sensor and the second sensor, and determine, based on the received data, a location of the irradiating amplified light beam relative to the target material in more than one dimension. |
申请公布号 |
US2014264091(A1) |
申请公布日期 |
2014.09.18 |
申请号 |
US201414184777 |
申请日期 |
2014.02.20 |
申请人 |
Cymer, LLC |
发明人 |
Fleurov Vladimir B.;Fomenkov Igor V. |
分类号 |
H05G2/00;G21K5/00 |
主分类号 |
H05G2/00 |
代理机构 |
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代理人 |
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主权项 |
1. A system for an extreme ultraviolet light source, the system comprising:
one or more optical elements positioned to receive a reflected amplified light beam and to direct the reflected amplified light beam into first, second, and third channels, the reflected amplified light beam comprising a reflection of at least a portion of an irradiating amplified light beam that interacts with a target material; a first sensor that senses light from the first channel; a second sensor that senses light from the second channel and the third channel, the second sensor having a lower acquisition rate than the first sensor; and an electronic processor coupled to a computer-readable storage medium, the medium storing instructions that, when executed, cause the processor to:
receive data from the first sensor and the second sensor, anddetermine, based on the received data, a location of the irradiating amplified light beam relative to the target material in more than one dimension. |
地址 |
San Diego CA US |