发明名称 SELF-ALIGNED APPROACH FOR DRAIN DIFFUSION IN FIELD EFFECT TRANSISTORS
摘要 A method for doping terminals of a field-effect transistor (FET), the FET including a drain region, a source region, and a surround gate surrounding a channel region, the method including depositing a dopant-containing layer, such that the surround gate prevents the dopant-containing layer from contacting the channel region of the FET, the dopant-containing layer including a dopant. The dopant then diffuses the dopant from the dopant-containing layer into at least one of the drain region and source region of the FET.
申请公布号 US2014264497(A1) 申请公布日期 2014.09.18
申请号 US201314037253 申请日期 2013.09.25
申请人 International Business Machines Corporation 发明人 Lam Chung H.;Li Jing
分类号 H01L21/225;H01L29/66;H01L29/78 主分类号 H01L21/225
代理机构 代理人
主权项 1. A field-effect transistor (FET) with a drain region, a source region, and a surround gate surrounding a channel region, the FET prepared by a process comprising the steps of: depositing a dopant-containing layer such that the surround gate prevents the dopant-containing layer from contacting the channel region of the FET, the dopant-containing layer including a dopant; and diffusing the dopant from the dopant-containing layer into at least one of the drain region and source region of the FET.
地址 Armonk NY US