发明名称 |
SELF-ALIGNED APPROACH FOR DRAIN DIFFUSION IN FIELD EFFECT TRANSISTORS |
摘要 |
A method for doping terminals of a field-effect transistor (FET), the FET including a drain region, a source region, and a surround gate surrounding a channel region, the method including depositing a dopant-containing layer, such that the surround gate prevents the dopant-containing layer from contacting the channel region of the FET, the dopant-containing layer including a dopant. The dopant then diffuses the dopant from the dopant-containing layer into at least one of the drain region and source region of the FET. |
申请公布号 |
US2014264497(A1) |
申请公布日期 |
2014.09.18 |
申请号 |
US201314037253 |
申请日期 |
2013.09.25 |
申请人 |
International Business Machines Corporation |
发明人 |
Lam Chung H.;Li Jing |
分类号 |
H01L21/225;H01L29/66;H01L29/78 |
主分类号 |
H01L21/225 |
代理机构 |
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代理人 |
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主权项 |
1. A field-effect transistor (FET) with a drain region, a source region, and a surround gate surrounding a channel region, the FET prepared by a process comprising the steps of:
depositing a dopant-containing layer such that the surround gate prevents the dopant-containing layer from contacting the channel region of the FET, the dopant-containing layer including a dopant; and diffusing the dopant from the dopant-containing layer into at least one of the drain region and source region of the FET. |
地址 |
Armonk NY US |