发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND DRY ETCHING APPARATUS FOR THE SAME |
摘要 |
A manufacturing method of a semiconductor device including arranging a compound semiconductor above a stage of a chamber, supplying an etching gas into the chamber, and generating a plasma in the chamber is provided. The compound semiconductor includes a group-III element nitride as a main component. A surface of the compound semiconductor is processed by a dry etching. Light is irradiated into the chamber during the generating of the plasma. A dry etching apparatus including a chamber including a stage, on which a compound semiconductor is mounted, and a light source irradiating light into the chamber is provided. The chamber is supplied with an etching gas. A plasma is generated in the chamber. A surface of the compound semiconductor is an object of a dry etching. |
申请公布号 |
US2014273482(A1) |
申请公布日期 |
2014.09.18 |
申请号 |
US201414159055 |
申请日期 |
2014.01.20 |
申请人 |
DENSO CORPORATION |
发明人 |
TSUCHIYA Yoshinori;HOSHI Shinichi;MATSUI Masaki |
分类号 |
H01L21/67;H01L21/3065 |
主分类号 |
H01L21/67 |
代理机构 |
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代理人 |
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主权项 |
1. A manufacturing method of a semiconductor device comprising:
arranging a compound semiconductor, which includes a group-III element nitride as a main component, above a stage of a chamber; supplying an etching gas into the chamber; and generating a plasma in the chamber, so that a surface of the compound semiconductor is processed by a dry etching, wherein light is irradiated into the chamber during the generating of the plasma. |
地址 |
Kariya-city JP |