发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND DRY ETCHING APPARATUS FOR THE SAME
摘要 A manufacturing method of a semiconductor device including arranging a compound semiconductor above a stage of a chamber, supplying an etching gas into the chamber, and generating a plasma in the chamber is provided. The compound semiconductor includes a group-III element nitride as a main component. A surface of the compound semiconductor is processed by a dry etching. Light is irradiated into the chamber during the generating of the plasma. A dry etching apparatus including a chamber including a stage, on which a compound semiconductor is mounted, and a light source irradiating light into the chamber is provided. The chamber is supplied with an etching gas. A plasma is generated in the chamber. A surface of the compound semiconductor is an object of a dry etching.
申请公布号 US2014273482(A1) 申请公布日期 2014.09.18
申请号 US201414159055 申请日期 2014.01.20
申请人 DENSO CORPORATION 发明人 TSUCHIYA Yoshinori;HOSHI Shinichi;MATSUI Masaki
分类号 H01L21/67;H01L21/3065 主分类号 H01L21/67
代理机构 代理人
主权项 1. A manufacturing method of a semiconductor device comprising: arranging a compound semiconductor, which includes a group-III element nitride as a main component, above a stage of a chamber; supplying an etching gas into the chamber; and generating a plasma in the chamber, so that a surface of the compound semiconductor is processed by a dry etching, wherein light is irradiated into the chamber during the generating of the plasma.
地址 Kariya-city JP