发明名称 SCREENING METHODOLOGY TO ELIMINATE WIRE SWEEP IN BOND AND ASSEMBLY MODULE PACKAGING
摘要 Quality control testing for a batch of electronic modules. A series of tests are performed on manufactured electronic modules, including tests sensitive to the failure rate of previously tested modules. Specifically, a first test comprised of two phases is performed on the module batch. Further screening is then performed responsive to detection of a wire sweep failure in a subset of failed modules from the first test phase. The further screening is on modules that passed the first test phase and excludes modules that failed the first test phase.
申请公布号 US2014266242(A1) 申请公布日期 2014.09.18
申请号 US201313834039 申请日期 2013.03.15
申请人 BUSINESS MACHINES CORPORATION INTERNATIONAL 发明人 Ayotte Stephen Peter;Gonzales Michael Russell Uy;Lam Mark Tiam Weng
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
主权项 1. A method comprising: performing quality control review for a plurality of electronic modules, each electronic module including a functional assembly of electronic components, and the quality control review including at least a first test phase; for each module determined to have failed the first test phase and responsive to detection of a wire sweep failure in a subset of failed modules from the first test phase, performing an electronic current leakage screening for each module determined to have passed the first test phase, wherein the leakage screening excludes each module determined to have failed the first test phase.
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