发明名称 Semiconductor wafer with a layer of AlzGa1-zN and process for producing it
摘要 <p>The invention concerns a semiconductor wafer comprising the following layers in the given order: - a monocrystalline substrate wafer (1) consisting essentially of silicon and having a (111) surface orientation, - a monocrystalline layer (3) of Sc 2 O 3 having a (111) surface orientation, - a monocrystalline layer (4) of ScN having a (111) surface orientation, and - a monocrystalline layer (6) of Al z Ga 1-z N with 0 ‰¤ z ‰¤ 1 having a (0001) surface orientation. The invention also concerns a process for producing this semiconductor wafer.</p>
申请公布号 EP2779213(A1) 申请公布日期 2014.09.17
申请号 EP20130158844 申请日期 2013.03.12
申请人 SILTRONIC AG;IHP GMBH-INNOVATIONS FOR HIGH PERFORMANCE MICROELECTRONICS / LEIBNIZ-INSTITUT FÜR INNOVATIVE MIKROELEKTRONIK 发明人 THAPA, SARAD BAHADUR;SCHRÖDER, THOMAS;TARNAWSKA, LIDIA
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
主权项
地址