| 发明名称 | Method and apparatus for selecting a reference gate | ||
| 摘要 | A method for selecting a reference gate includes acquiring a four-dimensional (4D) emission dataset of an object of interest, sorting the 4D emission dataset into a plurality of gates, calculating a slice activity value for each slice in the plurality of gates, generating a maximum difference value for each gate using the plurality of slice activity values, and selecting a reference gate based on the locations of the maximum difference values. An imaging system and a non-transitory computer readable medium are also described herein. | ||
| 申请公布号 | US8837799(B2) | 申请公布日期 | 2014.09.16 |
| 申请号 | US201213600997 | 申请日期 | 2012.08.31 |
| 申请人 | General Electric Company | 发明人 | Wollenweber Scott David |
| 分类号 | G06T7/00 | 主分类号 | G06T7/00 |
| 代理机构 | The Small Patent Law Group | 代理人 | Small Dean D.;The Small Patent Law Group |
| 主权项 | 1. A method for selecting a reference gate, said method comprising: acquiring a four-dimensional (4D) emission dataset of an object of interest; sorting the 4D emission dataset into a plurality of gates; calculating a slice activity value for each slice in the plurality of gates; generating a maximum difference value for each gate using the plurality of slice activity values; and selecting a reference gate based on the locations of the maximum difference values. | ||
| 地址 | Schenectady NY US | ||