发明名称 |
EXPOSURE APPARATUS AND EXPOSURE METHOD THEREOF |
摘要 |
A wafer alignment system is provided for performing a unidirectional scan-exposure. The wafer alignment system includes a plurality of wafer stages successively moving from a first position to a second position of a base cyclically. The wafer alignment method also includes an encoder plate having a first opening and a second opening. Further, the wafer alignment system includes a plurality of encoder plate readers and a plurality of wafer stage fiducials on the wafer stages. Further, the wafer alignment system also includes an alignment detection unit above the first opening of the encoder plate. |
申请公布号 |
US2014253897(A1) |
申请公布日期 |
2014.09.11 |
申请号 |
US201314040685 |
申请日期 |
2013.09.29 |
申请人 |
Semiconductor Manufacturing International (Shanghai) Corporation |
发明人 |
LIU CHANG;WU QIANG |
分类号 |
G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
|
代理人 |
|
主权项 |
1. A wafer alignment system, comprising:
a plurality of wafer stages successively moving from a first position to a second position of a base cyclically; an encoder plate having a first opening and a second opening; a plurality of encoder plate readers on the wafer stages; a plurality of wafer stage fiducials on the wafer stages; and an alignment detection unit above the first opening of the encoder plate; |
地址 |
Shanghai CN |