发明名称 EXPOSURE APPARATUS AND EXPOSURE METHOD THEREOF
摘要 A wafer alignment system is provided for performing a unidirectional scan-exposure. The wafer alignment system includes a plurality of wafer stages successively moving from a first position to a second position of a base cyclically. The wafer alignment method also includes an encoder plate having a first opening and a second opening. Further, the wafer alignment system includes a plurality of encoder plate readers and a plurality of wafer stage fiducials on the wafer stages. Further, the wafer alignment system also includes an alignment detection unit above the first opening of the encoder plate.
申请公布号 US2014253897(A1) 申请公布日期 2014.09.11
申请号 US201314040685 申请日期 2013.09.29
申请人 Semiconductor Manufacturing International (Shanghai) Corporation 发明人 LIU CHANG;WU QIANG
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项 1. A wafer alignment system, comprising: a plurality of wafer stages successively moving from a first position to a second position of a base cyclically; an encoder plate having a first opening and a second opening; a plurality of encoder plate readers on the wafer stages; a plurality of wafer stage fiducials on the wafer stages; and an alignment detection unit above the first opening of the encoder plate;
地址 Shanghai CN