| 发明名称 |
MAGNETIC AUTOMATIC TEST EQUIPMENT (ATE) MEMORY TESTER DEVICE AND METHOD EMPLOYING TEMPERATURE CONTROL |
| 摘要 |
In a particular embodiment, a method includes controlling a temperature within a chamber while applying a magnetic field. A device including a memory array is located in the chamber. The method includes applying a magnetic field to the memory array and testing the memory array during application of the magnetic field to the memory array at a target temperature. |
| 申请公布号 |
US2014254251(A1) |
申请公布日期 |
2014.09.11 |
| 申请号 |
US201313787938 |
申请日期 |
2013.03.07 |
| 申请人 |
QUALCOMM INCORPORATED |
发明人 |
Lee Kangho;Hsu Wah Nam;Lu Xiao;Kang Seung H. |
| 分类号 |
G11C29/04 |
主分类号 |
G11C29/04 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method comprising:
controlling a temperature within a chamber, wherein a device including a memory array is located in the chamber; applying a magnetic field to the memory array; and testing the memory array during application of the magnetic field to the memory array at a target temperature. |
| 地址 |
San Diego CA US |
