发明名称 |
Systems and methods for defect detection using exoelectrons |
摘要 |
An defect detection system includes an exoemission sensor having a conductive layer and an insulating layer. The exoemission sensor is mountable to a material of interest and configured to receive exoemissions from the material while in an atmosphere. The exoemission sensor outputs a signal based upon the received emissions. An analysis device is configured to receive the signal from the exoemission sensor and determine whether a defect is present in the material based upon the signal. |
申请公布号 |
US8829886(B2) |
申请公布日期 |
2014.09.09 |
申请号 |
US201113325731 |
申请日期 |
2011.12.14 |
申请人 |
General Electric Company |
发明人 |
Weaver Stanton Earl;Michael Joseph Darryl |
分类号 |
G01N27/00 |
主分类号 |
G01N27/00 |
代理机构 |
|
代理人 |
Klindtworth Jason K. |
主权项 |
1. A defect detection system comprising:
an exoemission sensor comprising a conductive layer and an insulating layer, the exoemission sensor mountable to a material of interest and configured to directly receive exoemissions from the material of interest, while in an atmosphere and electrically biased to the material of interest, and to output a signal based upon the received emissions; and an analysis device configured to receive the signal from the exoemission sensor and determine whether a defect is present in the material based upon the signal. |
地址 |
Niskayuna NY US |