发明名称 Systems and methods for defect detection using exoelectrons
摘要 An defect detection system includes an exoemission sensor having a conductive layer and an insulating layer. The exoemission sensor is mountable to a material of interest and configured to receive exoemissions from the material while in an atmosphere. The exoemission sensor outputs a signal based upon the received emissions. An analysis device is configured to receive the signal from the exoemission sensor and determine whether a defect is present in the material based upon the signal.
申请公布号 US8829886(B2) 申请公布日期 2014.09.09
申请号 US201113325731 申请日期 2011.12.14
申请人 General Electric Company 发明人 Weaver Stanton Earl;Michael Joseph Darryl
分类号 G01N27/00 主分类号 G01N27/00
代理机构 代理人 Klindtworth Jason K.
主权项 1. A defect detection system comprising: an exoemission sensor comprising a conductive layer and an insulating layer, the exoemission sensor mountable to a material of interest and configured to directly receive exoemissions from the material of interest, while in an atmosphere and electrically biased to the material of interest, and to output a signal based upon the received emissions; and an analysis device configured to receive the signal from the exoemission sensor and determine whether a defect is present in the material based upon the signal.
地址 Niskayuna NY US