| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a device which makes a sample quickly reach a target temperature, which can obtain physical property data during heat treatment as well as a conventional tension testing device, and which allows an X-ray diffractometer to perform structural change tracking simultaneously.SOLUTION: A tension testing device with a high temperature furnace includes: a tension testing device part for measuring the stress and elongation of a fibrous or film-like sample; and a high temperature furnace capable of changing an atmospheric temperature from room temperature to 1200°C. The high temperature furnace can move to a position of heating the sample after heating up to a predetermined temperature, and has windows capable of transmitting an X-ray on its both sides.</p> |
