发明名称 Medición de temperatura usando los cambios de la constante dieléctrica y la resonancia asociada
摘要 A temperature measurement technique for calculating a temperature in a high temperature environment by monitoring a change in resonant frequency of a resonant structure loaded with a dielectric material. A response curve for a reflection coefficient S11 associated with the resonant structure is generated, typically by the use of a network analyzer connected to the resonant structure via a cable. A minimum point for the response curve is identified to detect the resonant frequency for the resonant structure. A calibration map is applied to the minimum point to identify a temperature associated with the resonant frequency of the resonant structure. The temperature associated with the resonant frequency of the resonant structure represents the temperature of the high temperature environment.
申请公布号 ES2491225(T3) 申请公布日期 2014.09.05
申请号 ES20070755512T 申请日期 2007.04.13
申请人 RADATEC, INC. 发明人 BILLINGTON, SCOTT;GEISHEIMER, JONATHAN;HOLST, THOMAS
分类号 G01K7/32;G01K11/00 主分类号 G01K7/32
代理机构 代理人
主权项
地址